Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments
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DOI: 10.1109/tetc.2020.3025584
Abstract: With the rapid advancement of CMOS technologies, nano-scale CMOS latches have become increasingly sensitive to multiple-node upset (MNU) errors caused by radiations. First, this paper proposes a novel latch design, namely QNUTL that can completely… read more here.
Keywords: tolerant latch; quadruple node; node upsets; node upset ... See more keywords