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Published in 2022 at "IEEE Transactions on Emerging Topics in Computing"
DOI: 10.1109/tetc.2020.3025584
Abstract: With the rapid advancement of CMOS technologies, nano-scale CMOS latches have become increasingly sensitive to multiple-node upset (MNU) errors caused by radiations. First, this paper proposes a novel latch design, namely QNUTL that can completely…
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Keywords:
tolerant latch;
quadruple node;
node upsets;
node upset ... See more keywords