Quantification of Ion-Implanted Single-Atom Dopants in Monolayer MoS2 via HAADF STEM Using the TEMUL Toolkit
Sign Up to like & getrecommendations! Published in 2022 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927622000757
Abstract: Abstract In recent years, atomic resolution imaging of two-dimensional (2D) materials using scanning transmission electron microscopy (STEM) has become routine. Individual dopant atoms in 2D materials can be located and identified using their contrast in… read more here.
Keywords: ion implanted; quantification ion; microscopy; temul toolkit ... See more keywords