High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM.
Sign Up to like & getrecommendations! Published in 2017 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2017.07.004
Abstract: The adaptation of quantitative STEM techniques to enable atom-counting in supported metal nanoparticles with a modern, conventional (non-aberration-corrected) TEM/STEM (a JEOL JEM2100F) without the need for any modifications or special hardware is presented. No image… read more here.
Keywords: supported metal; metal nanoparticles; tem stem; quantitative stem ... See more keywords
Imaging Point Defects in Complex Oxides Using Quantitative STEM
Sign Up to like & getrecommendations! Published in 2017 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927617008509
Abstract: Previously, we have shown that HAADF-STEM can provide three-dimensional information of the location of individual dopant atoms in SrTiO3 from a single image [1]. The number of dopant atoms in a column and the depth… read more here.
Keywords: using quantitative; point defects; quantitative stem; imaging point ... See more keywords