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Published in 2024 at "Beilstein Journal of Nanotechnology"
DOI: 10.3762/bjnano.15.22
Abstract: To comprehensively study the influence of atomic force microscopy (AFM) scanning parameters on tip wear, a tip wear assessment method based on sharp structures is proposed. This research explored the wear of AFM tips during…
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Keywords:
quantitative wear;
tip wear;
sharp structures;
scanning parameters ... See more keywords