Extracting the Electromagnetic Radiated Emission Source of an Integrated Circuit by Rotating the Test Board in a TEM Cell Measurement
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DOI: 10.1109/temc.2018.2836698
Abstract: In this paper, the radiated emission of a microcontroller integrated circuit is investigated by rotating the test board in a transverse electromagnetic (TEM) cell measurement. The dependence of the radiated emission on the angle of… read more here.
Keywords: radiated emission; tem cell; tem; integrated circuit ... See more keywords