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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113437
Abstract: Abstract NanoXplore is the European pioneer vendor to develop ITAR-free radiation-hardened SRAM-based FPGAs. This work is the first to explore dynamic SEE tests in the NG-Medium FPGA device. The reliability-performance analysis of an embedded unmitigated…
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Keywords:
radiation hardened;
hardened sram;
sram based;
performance ... See more keywords
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Published in 2017 at "Journal of Applied Physics"
DOI: 10.1063/1.4981532
Abstract: In this work, we developed and exploited simulation tools to optimize the performances of rare earth doped fiber amplifiers (REDFAs) for space missions. To describe these systems, a state-of-the-art model based on the rate equations…
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Keywords:
fiber amplifiers;
radiation hardened;
space;
doped fiber ... See more keywords
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Published in 2022 at "IEEE Access"
DOI: 10.1109/access.2022.3157402
Abstract: SRAM cells are widely used to design memory blocks of, e.g., caches, register files, and translation lookaside buffers. Depending on the SRAM application, the design requirements are different. For instance, in space applications, alongside energy…
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Keywords:
cell;
space;
radiation hardened;
space applications ... See more keywords
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Published in 2023 at "IEEE Transactions on Aerospace and Electronic Systems"
DOI: 10.1109/taes.2022.3191296
Abstract: Radiation-hardened and high-voltage power circuits are key components in aerospace applications. However, when working at high voltages, the effects of the total ionizing dose (TID) and the single event limit the application of power driving…
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Keywords:
hardened mosfet;
radiation hardened;
tolerant radiation;
radiation ... See more keywords
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Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"
DOI: 10.1109/tcsi.2021.3074699
Abstract: Conventional hardened cells are not robust enough to single event upset (SEU) in 28nm technology due to the scaling of the transistors. High soft error rate is caused by particle striking at cells and logic…
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Keywords:
12t sram;
radiation hardened;
crossbar based;
based peripheral ... See more keywords
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Published in 2021 at "IEEE Transactions on Magnetics"
DOI: 10.1109/tmag.2020.3033229
Abstract: By scaling down the technology node to the deep nanoscale, the vulnerability of digital circuits to radiation and the intensive increase of leakage power have become of concern. Accordingly, designing radiation-hardened (rad-hard) memory elements based…
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Keywords:
radiation hardened;
non volatile;
energy efficient;
rad hard ... See more keywords
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Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2017.2728180
Abstract: Under radiation environment, conventional SRAMs suffer from high soft-error rate. To address this challenge, several radiation-hardened static-random access-memory (SRAM) cells such as twelve-transistor (12T) Dice and ten-transistor (10T) Quatro have been developed. Quatro is more…
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Keywords:
radiation hardened;
sram cell;
cell;
quatro ... See more keywords
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Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2017.2733738
Abstract: Voltage reference is the key module in analog and mixed-signal integrated circuits. This paper presents a radiation-hardened CMOS negative voltage reference for aerospace electronics. To improve the antiradiation performance, in the circuit design, the input…
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Keywords:
voltage;
cmos negative;
radiation hardened;
voltage reference ... See more keywords
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Published in 2020 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2020.3003333
Abstract: Radiation-hardened image sensors have been developed over the last few decades. Most of these studies have examined sensor properties before and after radiation, but few have described images during radiation. We have developed a new…
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Keywords:
radiation hardened;
cmos image;
image sensor;
sensor ... See more keywords
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Published in 2022 at "Micromachines"
DOI: 10.3390/mi13111802
Abstract: In aerospace environments, high reliability and low power consumption of chips are essential. To greatly reduce power consumption, the latches of a chip need to enter the power down operation. In this operation, employing non-volatile…
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Keywords:
operation;
radiation hardened;
power;
latch ... See more keywords