A Synchrotron Radiation Photoemission Study of SiGe(001)-2×1 Grown on Ge and Si Substrates: The Surface Electronic Structure for Various Ge Concentrations
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DOI: 10.3390/nano12081309
Abstract: Beyond the macroscopic perspective, this study microscopically investigates Si1−xGex(001)-2×1 samples that were grown on the epi Ge(001) and epi Si(001) substrates via molecular-beam epitaxy, using the high-resolution synchrotron radiation photoelectron spectroscopy (SRPES) as a probe.… read more here.
Keywords: epi 001; radiation photoemission; synchrotron radiation; study ... See more keywords