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Published in 2017 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2017.04.043
Abstract: In this work the serial combination of two RRAM cells is studied for the generation of a random bit. Measurements confirm that a serial reset operation, in which one of the two RRAMs switches to…
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Keywords:
random bits;
configuration;
generation random;
generation ... See more keywords