Fast Statistical Analysis of Rare Failure Events With Truncated Normal Distribution in High-Dimensional Variation Space
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3068107
Abstract: In this article, to accurately estimate the rare failure rates for large-scale circuits (e.g., SRAM) where process variations are modeled as truncated normal distributions in high-dimensional space, we propose a novel truncated scaled-sigma sampling (T-SSS)… read more here.
Keywords: rare failure; space; failure; truncated normal ... See more keywords
Correlated Rare Failure Analysis via Asymptotic Probability Evaluation
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3073075
Abstract: In this article, a novel asymptotic probability evaluation (APE) method is proposed to estimate the probability of correlated rare failure events for complex integrated systems containing a large number of replicated cells. The key idea… read more here.
Keywords: rare failure; failure; correlated rare; asymptotic probability ... See more keywords