Stitching interferometry for synchrotron mirror metrology at National Synchrotron Light Source II (NSLS-II)
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DOI: 10.1016/j.optlaseng.2019.105795
Abstract: Abstract With the fast development of diffraction-limited storage rings and free electron lasers, the requirement for ultimate quality X-ray mirror is getting higher and the mirror surface needs to approach the sub-nm root mean square… read more here.
Keywords: stitching interferometry; mirror; synchrotron; ray mirror ... See more keywords