Pinpointing lattice-matched conditions for wurtzite ScxAl1−xN/GaN heterostructures with x-ray reciprocal space analysis
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DOI: 10.1063/5.0221374
Abstract: Using comprehensive x-ray reciprocal space mapping, we establish the precise lattice-matching composition for wurtzite ScxAl1−xN layers on (0001) GaN to be x = 0.14 ± 0.01. 100 nm thick ScxAl1−xN films (x = 0.09–0.19) were grown in small composition increments on c-plane… read more here.
Keywords: wurtzite scxal1; ray reciprocal; pinpointing lattice; reciprocal space ... See more keywords