Robust ptychographic X-ray speckle tracking with multilayer Laue lenses.
Sign Up to like & getrecommendations! Published in 2022 at "Optics express"
DOI: 10.1364/oe.460903
Abstract: In recent years, X-ray speckle tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications, and have been actively developed for use at synchrotron light sources. Speckle techniques can recover an… read more here.
Keywords: speckle tracking; ray; multilayer laue; metrology ... See more keywords