Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC
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DOI: 10.1016/j.actamat.2021.116746
Abstract: Abstract The contrast features of synchrotron X-ray topographic images of screw-type basal plane dislocations (BPDs) in on-axis 4H-SiC wafers have been studied. Screw BPD images are categorized into two types: one exhibiting a white line… read more here.
Keywords: screw type; type basal; basal plane; ray topographic ... See more keywords