Ray Tracing Simulation of Images of Dislocations and Inclusions on X-Ray Topographs of GaAs Epitaxial Wafers
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DOI: 10.1007/s11664-020-07981-7
Abstract: In x-ray topography studies, ray tracing simulation has been particularly useful in identifying and characterizing Burgers vectors of dislocations using only one reflection instead of the traditional method of recording at least three reflections and… read more here.
Keywords: usepackage; ray topographs; tracing simulation; ray tracing ... See more keywords