Measurements of X-rays excited by pulsed beams of highly charged ions from EBIS
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DOI: 10.1088/1748-0221/20/06/c06004
Abstract: The measurements of X-rays excited by pulsed beams of highly charged ions from an Electron Beam Ion Source (EBIS), which were performed using fast silicon drift detector (SDD), are discussed in context of count losses… read more here.
Keywords: rays excited; beams highly; measurements rays; highly charged ... See more keywords