SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic Temperatures
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DOI: 10.1109/tns.2018.2880791
Abstract: This paper presents a modeling approach of single-event functional interrupt (SEFI) which takes into account all the physical and electrical processes from the radiation particle down to the event at the system level. This paper… read more here.
Keywords: readout integrated; heavy ions; integrated circuit; sefi modeling ... See more keywords