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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.4995580
Abstract: The recombination activity of threading dislocations in n-GaN with different dislocation densities and different doping levels was studied using electron beam induced current (EBIC). The recombination velocity on a dislocation, also known as the dislocation…
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Keywords:
dislocation;
dislocations gan;
properties dislocations;
recombination ... See more keywords