Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling
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DOI: 10.1109/tcad.2020.3023684
Abstract: In this study, a novel method for the detection of recycled field-programmable gate arrays (FPGAs) is proposed. This method is based on with-in die (WID) process variation model over an exhaustive path characterization [referred to… read more here.
Keywords: detection; variation; wid process; recycled fpga ... See more keywords