LAUSR

Reduced-Pin-Count BOST for Test-Cost Reduction

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1 Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2021.3065912

Abstract: Built-off self-test (BOST) is a widely used technique to reduce the test cost. It makes it possible to test high-speed dynamic random-access memory (DRAM) without using a costly high-performance automatic test equipment (ATE). However, the… read more here.

Keywords: reduced pin; cost reduction; cost; test cost ... See more keywords