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Published in 2021 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2021.3068149
Abstract: The current work describes a method for dealing with an anomalous background observed in parallel to the signal of interest (X-rays or gammas) on spectroscopic silicon drift detector (SDD) arrays exposed to large fluxes of…
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Keywords:
background;
mips charge;
reducing mips;
sdd ... See more keywords