Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Terahertz Science and Technology"
DOI: 10.1109/tthz.2020.2999631
Abstract: This article presents a study of different calibration techniques for vector network analyzer -based material measurements using commercially available material characterization kits (MCKs). Such MCKs are designed for fast broadband material characterization at millimeter-wave and… read more here.
Keywords: calibration; reflect line; material; material characterization ... See more keywords
Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration
Sign Up to like & getrecommendations! Published in 2023 at "Micromachines"
DOI: 10.3390/mi14010215
Abstract: Graphene has unique properties that can be exploited for radiofrequency applications. Its characterization is key for the development of new graphene devices, circuits, and systems. Due to the two-dimensional nature of graphene, there are challenges… read more here.
Keywords: graphene; calibration; thru reflect; reflect line ... See more keywords