In Situ Reflectometry and Diffraction Investigation of the Multiscale Structure of p-Type Polysilicon Passivating Contacts for c-Si Solar Cells
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DOI: 10.1021/acsami.2c01225
Abstract: The integration of passivating contacts based on a highly doped polycrystalline silicon (poly-Si) layer on top of a thin silicon oxide (SiOx) layer has been identified as the next step to further increase the conversion… read more here.
Keywords: layer; passivating contacts; solar cells; reflectometry diffraction ... See more keywords