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Published in 2017 at "Physical review applied"
DOI: 10.1103/physrevapplied.7.054004
Abstract: The step-wise growth of epitaxial Fe on Cu(001)/Si(001), investigated by in-situ polarized neutron reflectometry is presented. A sputter deposition system was integrated into the neutron reflectometer AMOR at the Swiss neutron spallation source SINQ, which…
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Keywords:
neutron reflectometry;
growth;
reflectometry epitaxial;
film ... See more keywords