Effect of reflection and refraction on NEXAFS spectra measured in TEY mode
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Synchrotron Radiation"
DOI: 10.1107/s1600577517016253
Abstract: A study of the effect of reflection and refraction processes on the evolution of the total-electron-yield spectrum over a wide range of incidence angles including grazing angles is reported. read more here.
Keywords: effect reflection; refraction nexafs; reflection refraction;