X‐ray diffraction microscopy based on refractive optics
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DOI: 10.1107/s1600576717011037
Abstract: A formalism is presented for dark-field X-ray microscopy using refractive optics. The new technique can produce three-dimensional maps of lattice orientation and axial strain within millimetre-sized sampling volumes and is particularly suited to in situ… read more here.
Keywords: diffraction microscopy; refractive optics; ray diffraction; microscopy ... See more keywords