Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices
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DOI: 10.1109/ted.2017.2733043
Abstract: Conventionally, integrated drain-extended MOS (DeMOS) like high-voltage devices are designed while keeping only performance targets for a given application in mind. In this paper, for the first time, performance and reliability codesign approach using 3-D… read more here.
Keywords: reliability codesign; drain extended; extended mos; performance ... See more keywords