The Dark Side: Security and Reliability Concerns in Machine Learning for EDA
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2022.3199172
Abstract: The growing integrated circuit complexity has led to a compelling need for design efficiency improvement through new electronic design automation (EDA) methodologies. In recent years, many unprecedented efficient EDA methods have been enabled by machine… read more here.
Keywords: dark side; reliability concerns; machine learning; reliability ... See more keywords