Enhanced Reliability and Controllability in Filamentary Oxide‐Based 3D Vertical Structured Resistive Memory with Pulse Scheme Algorithm for Versatile Neuromorphic Applications
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DOI: 10.1002/adfm.202500956
Abstract: This study explores the application of the incremental step pulse with verify algorithm (ISPVA) scheme in Pt/TiOX/TiN vertical resistive random‐access memory (VRRAM) devices to enhance both the reliability and controllability of resistive switching. ISPVA improves… read more here.
Keywords: scheme; dependent plasticity; reliability controllability; memory ... See more keywords