Enhancing Reliability of Emerging Memory Technology for Machine Learning Accelerators
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DOI: 10.1109/tetc.2020.2984992
Abstract: An efficient and reliable Multi-Level Cell (MLC) Spin-Transfer Torque Random Access Memory (STT-RAM) is proposed based on a Drop-And-Rearrange Approach, called DARA. Since CNN models are rather robust, less important bits are dropped, allowing important… read more here.
Keywords: underline underline; memory; reliability emerging; enhancing reliability ... See more keywords