Articles with "reliability igbt" as a keyword



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IGBT Junction Temperature Measurements: Inclusive of Dynamic Thermal Parameters

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Published in 2019 at "IEEE Transactions on Device and Materials Reliability"

DOI: 10.1109/tdmr.2019.2910182

Abstract: Insulated gate bipolar transistors (IGBTs) are widely used in new energy fields, such as wind power converters and electric vehicles. The junction temperature characteristics and junction temperature measurements greatly influence the reliability of the IGBT.… read more here.

Keywords: method; junction temperature; temperature measurements; reliability igbt ... See more keywords