An Aging-Aware Reliable FinFET-Based Low-Power 32-Word $$\times $$× 32-bit Register File
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DOI: 10.1007/s00034-017-0638-y
Abstract: As the VLSI technology is heading toward deep subnanometer range, the NBTI effect has emerged as a major reliability issue for the state-of-the-art CMOS as well as FinFET-based circuits. NBTI causes an incremental deviation in… read more here.
Keywords: based low; register file; reliable finfet; low power ... See more keywords