Spatially Resolved Thermometry of Resistive Memory Devices
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DOI: 10.1038/s41598-017-14498-3
Abstract: The operation of resistive and phase-change memory (RRAM and PCM) is controlled by highly localized self-heating effects, yet detailed studies of their temperature are rare due to challenges of nanoscale thermometry. Here we show that… read more here.
Keywords: memory; thermometry; resolved thermometry; resistive memory ... See more keywords