Real-Time Characterization Using in situ RHEED Transmission Mode and TEM for Investigation of the Growth Behaviour of Nanomaterials
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DOI: 10.1038/s41598-018-19857-2
Abstract: A novel characterization technique using both in situ reflection high-energy electron diffraction (RHEED) transmission mode and transmission electron microscopy (TEM) has been developed to investigate the growth behaviour of semiconductor nanostructures. RHEED employed in transmission… read more here.
Keywords: rheed transmission; transmission; growth behaviour; transmission mode ... See more keywords