Windowed Fourier ridges for demodulation of carrier fringe patterns with nonlinearity: a theoretical analysis.
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DOI: 10.1364/ao.57.006198
Abstract: Accurately extracting phase or phase derivative is the most important requirement in optical metrology. However, in practice, there are many error sources, among which nonlinear distortion in fringe patterns is often encountered. Several techniques have… read more here.
Keywords: error; ridges demodulation; fourier ridges; windowed fourier ... See more keywords