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Published in 2020 at "Cement and Concrete Research"
DOI: 10.1016/j.cemconres.2020.105999
Abstract: Abstract X-ray diffraction (XRD) is a prominent technique to characterise cement-based materials. The combination of the Rietveld refinement with the Partial Or No Known Crystal Structure (PONKCS) approach now enables the quantification of both crystalline…
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Keywords:
cement pastes;
method;
rietveld ponkcs;
cement ... See more keywords