Revealing correlation of core‒rim structures, defects and stacking-faults in SiC ceramics by integrated scanning electron microscopy
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DOI: 10.1016/j.jeurceramsoc.2020.09.019
Abstract: Abstract Dopant distribution is key to understand sintering behavior and microstructure‒property relationship of silicon carbide (SiC) ceramics. Using high-angle secondary-electron (SE) imaging in scanning electron microscope combining elemental and cathodoluminescence (CL) analysis, core‒rim structures were… read more here.
Keywords: sic ceramics; rim structures; core rim; microscopy ... See more keywords