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Published in 2017 at "IEEE Computer Architecture Letters"
DOI: 10.1109/lca.2016.2614497
Abstract: Scaling down DRAM technology degrades cell reliability due to increased coupling between adjacent DRAM cells, commonly referred to as crosstalk. Moreover, high access frequency of certain cells (hot cells) may cause data loss in neighboring…
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Keywords:
row;
row hammering;
dram;
based tree ... See more keywords