A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection
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DOI: 10.1109/jssc.2021.3101209
Abstract: Computing-in-memory (CIM) architectures have gained importance in achieving high-throughput energy-efficient artificial intelligence (AI) systems. Resistive RAM (RRAM) is a promising candidate for CIM architectures due to a multiply-and-accumulate (MAC)-friendly structure, high bit density, compatibility with… read more here.
Keywords: macro supporting; voltage sensing; rram macro; digital rram ... See more keywords