Investigation of the Meyer-Neldel Rule in Si MOSFETs
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DOI: 10.1109/led.2020.3033583
Abstract: We show that a Meyer-Neldel (MN) regime, usually reported for disordered materials, is found in state-of-the-art monocrystalline Si MOSFETs. This unexpected result is explained via device simulation in terms of the self-consistency between the mobile… read more here.
Keywords: neldel rule; rule mosfets; meyer; investigation meyer ... See more keywords