Very high fluence nitrogen implantations in metals studied by Rutherford Backscattering Spectrometry
Sign Up to like & getrecommendations! Published in 2018 at "Surface and Coatings Technology"
DOI: 10.1016/j.surfcoat.2018.01.042
Abstract: Abstract This paper reports a study of 14N+ implanted Ti and Zr films analysed by Rutherford Backscattering Spectrometry (RBS). The fluences ranged from 4.0–10.0 × 1017 atoms·cm−2 and energies of 15–20 keV. Here, the nitrogen depth distributions were obtained… read more here.
Keywords: nitrogen; rutherford backscattering; high fluence; backscattering spectrometry ... See more keywords
New developments in the simulation of Rutherford backscattering spectrometry in channeling mode using arbitrary atom structures
Sign Up to like & getrecommendations! Published in 2020 at "Modelling and Simulation in Materials Science and Engineering"
DOI: 10.1088/1361-651x/ab81a9
Abstract: As Rutherford Backscattering Spectrometry in Channeling mode (RBS/C) is an efficient technique for characterizing crystallographic defects, its computational simulation has drawn attention over the past several decades. Recently, a RBS/C simulation code based on the… read more here.
Keywords: spectrometry channeling; rutherford backscattering; channeling mode; backscattering spectrometry ... See more keywords