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Published in 2017 at "Vacuum"
DOI: 10.1016/j.vacuum.2016.12.001
Abstract: Abstract We measured the band offsets of sputtered Sc 2 O 3 on thin film InGaZnO 4 (IGZO) using X-Ray Photoelectron Spectroscopy and obtained the bandgaps of the materials using reflection electron energy loss spectroscopy…
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Keywords:
ingazno4 heterojunctions;
band offsets;
sputtered sc2o3;
sc2o3 ingazno4 ... See more keywords