Determination of DC equivalent hot carrier stress times in scaled CMOS devices using novel AC stress methodology
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DOI: 10.1016/j.microrel.2018.12.012
Abstract: Abstract A new AC hot carrier injection (HCI) test methodology replicating the switching in digital CMOS circuits is introduced to correlate HCI in discrete scaled CMOS devices to HCI in logic circuits. This technique allows… read more here.
Keywords: hot carrier; methodology; cmos devices; stress ... See more keywords