Co-relation scan attack analysis (COSAA) on AES: A comprehensive approach
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DOI: 10.1016/j.microrel.2021.114216
Abstract: Abstract Scan based DfT is indispensable for IC testing in the semiconductor chip industry to ensure correctness of chip, both functionally and structurally. Since a higher degree of fault coverage is essential, cryptographic ICs rely… read more here.
Keywords: attack; aes; cosaa aes; scan attack ... See more keywords