Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Circuits and Systems II: Express Briefs"
DOI: 10.1109/tcsii.2022.3200923
Abstract: Conventional diagnosis methods are performed at the library cell level, which identify only defective cells. In reality, many defects affecting the inside of the cells cannot be identified, limiting yield improvement. To overcome the limit,… read more here.
Keywords: scan chain; cell; diagnosis; cell aware ... See more keywords
Optimized Design of an LSSD Scan Cell
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2016.2589548
Abstract: Type D flip-flop cell and its scannable version called Muxed-D are the most used sequential components in cell-based synchronous designs because it simplifies timing analysis and it is less susceptible to race problems. However, as… read more here.
Keywords: optimized design; lssd scan; scan cell; cell ... See more keywords