Mitigating Observability Loss of Toggle-Based X-Masking via Scan Chain Partitioning
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DOI: 10.1109/tc.2018.2801847
Abstract: The Toggle-based X-masking method requires a single toggle at a given cycle, there is a chance that non-X values are also masked. Hence, the non-X value over-masking problem may cause a fault coverage degradation. In… read more here.
Keywords: scan chain; toggle based; chain partitioning; italic italic ... See more keywords
Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan by Observation Points
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DOI: 10.1109/tcad.2017.2748020
Abstract: Observation points in the combinational logic of a circuit can aid in the diagnosis of logic defects by reducing the number of indistinguished fault pairs. This paper considers the use of observation points in the… read more here.
Keywords: chain; chain faults; combinational logic; observation points ... See more keywords
Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis
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DOI: 10.1109/tcsii.2022.3200923
Abstract: Conventional diagnosis methods are performed at the library cell level, which identify only defective cells. In reality, many defects affecting the inside of the cells cannot be identified, limiting yield improvement. To overcome the limit,… read more here.
Keywords: scan chain; cell; diagnosis; cell aware ... See more keywords