Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults
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DOI: 10.1109/tvlsi.2020.3038368
Abstract: The use of both broadside (launch-on-capture) and skewed-load (launch-on-shift) tests for delay faults results in increased delay fault coverage and better test compaction than the use of a single test type. Two-cycle broadside and skewed-load… read more here.
Keywords: skewed load; scan enable; broadside skewed; test ... See more keywords