Imaging hole-density inhomogeneity in arsenic-doped CdTe thin films by scanning capacitance microscopy
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DOI: 10.1016/j.solmat.2020.110468
Abstract: Abstract We report nanometer-scale hole-density imaging in As-doped CdTe films by scanning capacitance microscopy (SCM). The hole-density profiling is validated by contrasting a CdTe cross-section sample made by molecular-beam epitaxy with systematically increased As doping… read more here.
Keywords: microscopy; films scanning; scanning capacitance; doped cdte ... See more keywords