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Published in 2019 at "Physical Review Applied"
DOI: 10.1103/physrevapplied.11.034069
Abstract: We introduce a new scanning probe technique derived from scanning gate microscopy (SGM) in order to investigate thermoelectric transport in two-dimensional semiconductor devices. The thermoelectric scanning gate Microscopy (TSGM) consists in measuring the thermoelectric voltage…
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Keywords:
microscopy;
thermoelectric scanning;
interferometry;
point contact ... See more keywords