Conductive Filament Localization Within Crossbar Resistive Memories by Scanning Joule Expansion Microscopy
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DOI: 10.1109/led.2020.2986543
Abstract: Control of filament growth within conductive bridge random access memories (CBRAM) is of crucial interest in order to ensure the reliability of such emerging devices. Here, we demonstrate that Scanning Joule Expansion Microscopy (SJEM) can… read more here.
Keywords: microscopy; conductive filament; scanning joule; joule expansion ... See more keywords