Blisters on graphite surface: a scanning microwave microscopy investigation
Sign Up to like & getrecommendations! Published in 2019 at "RSC Advances"
DOI: 10.1039/c9ra04667d
Abstract: Blisters formed on an electrochemically treated HOPG are investigated by Scanning Microwave Microscopy that allows a spectroscopic and sub-surface characterization. read more here.
Keywords: microscopy; microwave microscopy; scanning microwave; blisters graphite ... See more keywords
Application of Near-Field Scanning Microwave Microscopy in Liquid Environment
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Access"
DOI: 10.1109/access.2022.3190606
Abstract: In this article, a method of illustrating the electromagnetic properties of liquid specimens is proposed by our homemade near-field scanning microwave microscopy (NSMM). By introducing the fundamental theorem of NSMM and conducting a simulation on… read more here.
Keywords: microwave microscopy; near field; microscopy; scanning microwave ... See more keywords
An Improved Resampling Method for Brightness Temperature of HY-2B Scanning Microwave Radiometer
Sign Up to like & getrecommendations! Published in 2024 at "IEEE Geoscience and Remote Sensing Letters"
DOI: 10.1109/lgrs.2024.3388433
Abstract: The scanning microwave radiometer (SMR) onboard the Haiyang-2B satellite (HY-2B) can provide valuable observation data for various research fields. Resampling enables consistent spatial characteristics of SMR brightness temperature (BT) data from different channels, which is… read more here.
Keywords: scanning microwave; method; improved resampling; resampling method ... See more keywords
Defect Detection in Graphene Preparation Based on Near-Field Scanning Microwave Microscopy
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Microwave and Wireless Components Letters"
DOI: 10.1109/lmwc.2020.3006233
Abstract: In this letter, a nondestructive local characterization of graphene fabricated by the reduction method on graphene oxide aqueous was demonstrated by using a near-field scanning microwave microscopy (NSMM). The dielectric properties of graphene films have… read more here.
Keywords: near field; microscopy; graphene; field scanning ... See more keywords
Nonlinear Reconstruction of Multilayer Media in Scanning Microwave Microscopy
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2018.2834058
Abstract: Scanning microwave microscopy (SMM) is a nanoscale characterization technique widely used to image electrical or magnetic properties of materials at microwave frequencies. Nevertheless, it is challenging to reconstruct the properties of materials from measured SMM… read more here.
Keywords: multilayer media; microscopy; microwave microscopy; scanning microwave ... See more keywords
Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Microwave Theory and Techniques"
DOI: 10.1109/tmtt.2016.2642940
Abstract: A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a… read more here.
Keywords: description inhomogeneous; microscopy; samples scanning; scanning microwave ... See more keywords
Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy
Sign Up to like & getrecommendations! Published in 2022 at "Scanning"
DOI: 10.1155/2022/1306000
Abstract: In the field of materials research, scanning microwave microscopy imaging has already become a vital research tool due to its high sensitivity and nondestructive testing of samples. In this article, we review the main theoretical… read more here.
Keywords: microwave microscopy; microscopy; interfacial measurement; scanning microwave ... See more keywords
Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy
Sign Up to like & getrecommendations! Published in 2021 at "Nanomaterials"
DOI: 10.3390/nano11030820
Abstract: Reference samples are commonly used for the calibration and quantification of nanoscale electrical measurements of capacitances and dielectric constants in scanning microwave microscopy (SMM) and similar techniques. However, the traceability of these calibration samples is… read more here.
Keywords: capacitance measurements; uncertainty; microscopy; scanning microwave ... See more keywords